RITtrend™ allows you to view your current and historical data, and based on any identified trends, establish well-defined, well-reasoned tolerance specifications that are particular to your machine. From within RITtrend™, you can set minimum and maximum values, view moving means, identify outliers, and monitor trends or drift.
Run a test analysis routine, and with one click, add the analysis record to the RITtrend™ SQL-based database. All common tasks (such as as querying, managing tolerances, and SPC limits) are simplified to maximize efficiency and reduce the time it takes by more than 80%. The intuitive interface allows for dynamic visualization and management of large homogeneous data sets, generated from many MLC tests.
Visually view your data in a statistical process control chart, tabular format, or a customizable RITG142 report.
Conveniently locate your database anywhere on your local machine, a network, or in the cloud.
Your data is automatically-compared to your specifications with discrepancy alerts, via email or SMS notifications, when the data exceeds customizable warning and failure limits or SPC control limits.
RITtrend™ is a trademark of Radiological Imaging Technology, Inc.